Gain sector 1 chip 3 (Oct. 03)

Data from silicon test log p. 79 6/17/03

for voltage at the buffer out of the chip

To find capacitance of the sense node

Charge from the Fe55 X-ray

Voltage change on the sense node for Fe55 total charge

Capacitance of the sense node

Pixel source follower gain (Yandong Chen)

Buffer source follower gain (Yandong Chen)

ADC counts in the total Fe55 X-ray

Measured node capacitance chip 3 sector 1

Node capacitance of chip 3 sector 1 from silicon parameters

Node capacitance chip 1 sector 1

Node gain, chip 3 sector 1

Buffer out gain, chip 3 sector 1

Expected KTC fluctuations at the buffer output (expectations can be lower by 1/root(2))